ZEISS Industrial Metrology to show the latest technologies and solutions for advancing quality networking at IMTS 2016

This is also the year that ZEISS celebrates the 200^th birthday of the founder, Carl Zeiss. To mark this anniversary, visitors will have the opportunity to look at the life of Carl Zeiss and learn about the special stories and challenges he faced when founding the company and understand its 170-year history. Visitors will have a chance to win a 144-page biography about Carl Zeiss and ZEISS gear, a replica of an early ZEISS microscope, and a pair of ZEISS binoculars.

Latest technologies
Companies can now choose between a ZEISS METROTOM 800 with a tube voltage of 225 kV and a version with a tube voltage of 130 kV. The significant increase in power from 39 to 500 watts on the ZEISS METROTOM 800 allows for scanning of components made of metal or mixed materials. Operators will also receive information about the entire component with the new ZEISS METROTOM 1500/225 kV, allowing significantly larger components to be scanned. The new ZEISS DotScan family of chromatic white light sensors is now available on new ZEISS ACCURA multisensor coordinate measurement machines.

Optical and optical-contact systems
The ZEISS COMET L3D 2 uses the latest sensor technology and project-oriented software for easy and reliable 3D data capture. With a range of working distances from 45-500 mm, the ZEISS COMET L3D 2 camera ensures problem-free operation. The ZEISS O-SELECT optical measuring system continues to close the gaps in the quality assurance process with continued developments to meet even more customer requirements. The system's ISO 10360 compliancy still leads the way for traceable and reproducible measurement values. O-SELECT has a high level of automation and ease of use that is now proven to excel in the inspection of translucent parts, in addition to common punched, turned or bending parts, or injection-molded and laser-cut workpieces. Users of ZEISS O-INSPECT multisensor measuring machines are no longer limited to two system sizes. 2D and 3D characteristics can now be measured with three different systems with measuring volumes up to 800 x 600 x 300 mm.

Flexible surface and roundness measurement systems
The NEX series of surface and roundness instruments allows both types of measurements to be completed with one system. SURFCOM NEX offers a single hybrid detector to measure surface texture and contour at the same time. RONDCOM NEX offers best-in-class spindle accuracy and allows optional surface roughness measurements in the horizontal, vertical and radial axes.

Temperature and data management
The ZEISS TEMPAR package records room temperatures with the highest precision and enables the exact monitoring of the machine environment, resulting in more precise measurements. The clearly arranged user interface enables customers to record, display and save sensor data and calibration information. Local and global access to temperature data is possible in combination with ZEISS PiWeb software.

ZEISS PiWeb software combines measurement data from multiple systems into graphical part stories, SPC charts, quality documents and dashboards. It allows engineering, production and quality managers easy, remote access to all reports at any time. IMTS attendees can learn about the advancement of quality networks first hand from ZEISS experts.

For more information visit www.zeiss.com/metrology or call 1-800-327-9735.

Photo - http://photos.prnewswire.com/prnh/20160816/398622

SOURCE Carl Zeiss Industrial Metrology, LLC

Related Links

http://www.zeiss.com/metrology