National Instruments Announces 2010 Automated Test Outlook
Report Details Key Innovations and Methodologies Impacting Test and Measurement Across Multiple Industries
AUSTIN, Texas, April 13, 2010 /PRNewswire-FirstCall/ -- National Instruments (Nasdaq: NATI) today announced the availability of its 2010 Automated Test Outlook report, which shares findings of the company's research into innovations and technologies shaping today's test and measurement applications. The business and technology insights presented in the outlook apply across many industries including communications, aerospace and defense, semiconductor, automotive and consumer electronics. The goal of the 2010 Automated Test Outlook is to help engineers and managers gain further insight into the cross-industry trends impacting their organizations.
The extensive understanding of technology trends that National Instruments has gained through its interaction with companies across many sectors provides a unique vantage point on the direction of the test and measurement market. The 2010 Automated Test Outlook combines input from academic research, business intelligence, user surveys, online forums, customer advisory board feedback and field sales discussions. With this data as its foundation, the report builds a broad representation of the next generation of trends and methodologies addressing the business and technical challenges in test and measurement.
The 2010 Automated Test Outlook is organized into five categories: Business Strategy, Architectures, Computing, Software and I/O. Within each of the five categories, the report details a trend, methodology or technology impacting test and measurement. Topics that the 2010 report discusses are listed below:
- Standardization: Developing a common test platform reduces costs and increases reuse throughout the product life cycle
- Multichannel RF Test: Testing next-generation wireless devices requires a highly synchronized parallel test architecture from signal to software
- Peer-to-Peer Computing: Increasingly complex testing requirements require higher performance and point-to-point computing architectures
- Embedded Design and Test: Real-time test software helps engineers reuse tests alongside their embedded system models throughout the development process
- Reconfigurable Instruments: Field-programmable gate array (FPGA)-based instruments deliver a new level of performance and flexibility by facilitating reconfigurability down to the hardware
To view the 2010 Automated Test Outlook, readers can visit www.ni.com/ato.
About National Instruments
National Instruments (www.ni.com) is transforming the way engineers and scientists design, prototype and deploy systems for measurement, automation and embedded applications. NI empowers customers with off-the-shelf software such as NI LabVIEW and modular cost-effective hardware, and sells to a broad base of more than 30,000 different companies worldwide, with no one customer representing more than 3 percent of revenue and no one industry representing more than 15 percent of revenue. Headquartered in Austin, Texas, NI has more than 5,000 employees and direct operations in more than 40 countries. For the past 11 years, FORTUNE magazine has named NI one of the 100 best companies to work for in America. Readers can obtain investment information from the company's investor relations department by calling (512) 683-5090, e-mailing [email protected] or visiting www.ni.com/nati.
(NATI-G)
LabVIEW, National Instruments, NI and ni.com are trademarks of National Instruments. Other product and company names listed are trademarks or trade names of their respective companies.
Editor Contact: Hilary Marchbanks, (512) 683-5937
SOURCE National Instruments
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